THE EFFECT OF ROUGHNESS ON THE MAGNETORESISTANCE OF FE CR MULTILAYERS/

Authors
RENSING NM PAYNE AP CLEMENS BM
Citation
Nm. Rensing et al., THE EFFECT OF ROUGHNESS ON THE MAGNETORESISTANCE OF FE CR MULTILAYERS/, Journal of magnetism and magnetic materials, 121(1-3), 1993, pp. 436-439
Citations number
9
Categorie Soggetti
Material Science","Physics, Condensed Matter
Journal title
Journal of magnetism and magnetic materials → ACNP
ISSN journal
03048853
Volume
121
Issue
1-3
Year of publication
1993
Pages
436 - 439
Database
ISI
SICI code
0304-8853(1993)121:1-3<436:TEOROT>2.0.ZU;2-R
Abstract
We investigated magnetoresistance in wedged Fe/Cr multilayers grown at several sputtering pressures. Low angle X-ray scattering showed that interface roughness increased with higher sputtering pressure. The inc reased roughness was accompanied by an increase in saturation resistan ce, which results in a decrease in fractional magnetoresistance. The m aximum magnetoresistance (measured at room temperature) was 7.3 and 4. 0% for the films grown at 1.4 and 10 mT Ar, respectively, both at the region with 13 angstrom Cr layers.