ELECTRON-DIFFRACTION INVESTIGATION OF CO2-XE SOLIDIFIED MIXTURES

The structure of condensed films of CO2-Xe is studied in a temperature range of 6 to 60 K. The gas mixtures the composition of which varies between 0 and 100% Xe are deposited at substrate temperatures of 55 an d 6 K. it is found that under high-temperature deposition, up to 5 mol . % Xe dissolves in the CO2 matrix while the dissolution Of CO2 in Xe is beyond the electron diffraction technique sensitivity. The structur e and the substructure of the low-temperature condensates and the kine tic of relaxation processes induced by annealing of the films are cons idered.