ATOMIC LAYER EPITAXY OF GAAS WITH A 2-MU-M H GROWTH-RATE/

Citation
A. Dip et al., ATOMIC LAYER EPITAXY OF GAAS WITH A 2-MU-M H GROWTH-RATE/, Applied physics letters, 62(19), 1993, pp. 2378-2380
Citations number
7
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
62
Issue
19
Year of publication
1993
Pages
2378 - 2380
Database
ISI
SICI code
0003-6951(1993)62:19<2378:ALEOGW>2.0.ZU;2-F
Abstract
Atomic layer epitaxy (ALE) of GaAs with a growth rate as high as 2 mum /h was achieved in a specially designed reactor based on the rotating susceptor concept. High deposition rates are made possible by a unique partition system that permits rapid rotation of substrates between si multaneous streams of columns III and V reactant gases. Mixing of the gas streams at high rotational speeds is avoided by the gas shearing e ffect provided by the partition system. Background carbon levels in th e GaAs films with high growth rates varied from mid 10(17) cm-3 at 650 -degrees-C to mid 10(18) cm-3 at 550-degrees-C. When the growth rate w as reduced to 0.3 mum/h, carbon background doping in the 10(15) cm-3 w as achieved.