PROPERTIES OF EPITAXIAL SRRUO3 THIN-FILMS

Citation
Xd. Wu et al., PROPERTIES OF EPITAXIAL SRRUO3 THIN-FILMS, Applied physics letters, 62(19), 1993, pp. 2434-2436
Citations number
8
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
62
Issue
19
Year of publication
1993
Pages
2434 - 2436
Database
ISI
SICI code
0003-6951(1993)62:19<2434:POEST>2.0.ZU;2-1
Abstract
SrRuO3 thin films were deposited on (100) LaAlO3 using pulsed laser de position. The films were (001) oriented normal to the substrate surfac e with a high degree of in-plane orientation with respect to the subst rate's major axes. An ion beam minimum yield of 2.5% was obtained for the films, indicating high crystallinity. The films exhibited metallic behavior with a room temperature resistivity of approximately 200 mW cm. A kink in the resistivity, corresponding to a ferromagnetic phase transition, was observed at approximately 160 K. It was found that SrR uO3 is structurally and chemically compatible with the YaB2Cu3O7-d (YB CO) superconductors. High quality YBCO films were obtained on SrRuO3 L aAlO3. Multilayers of YBCO/SrRuO3 were successfully fabricated.