Tr. Ayres, SIGNAL-TO-NOISE RATIOS IN IUE LOW-DISPERSION SPECTRA .2. PHOTOMETRICALLY CORRECTED IMAGES, Publications of the Astronomical Society of the Pacific, 105(687), 1993, pp. 538-550
Citations number
10
Categorie Soggetti
Astronomy & Astrophysics
Journal title
Publications of the Astronomical Society of the Pacific
The character of detector noise is explored in photometrically correct
ed images from the short-wavelength and long-wavelength prime intensif
ied vidicon cameras of the International Ultraviolet Explorer. A proto
col is proposed for deriving realistic ''noise models''-crucial to the
application of Optimal extraction algorithms like that of Kinney, Boh
lin, and Neill (1991, PASP, 103, 694)-from the available collections o
f UV-Flood calibration images. The protocol includes evaluation of the
''noise-filtering'' properties of the SWP and LWP cameras through 2-D
spatial power spectrum analysis. The two vidicon cameras behave nearl
y identically. For both, the incomplete removal of the pixel-to-pixel
sensitivity pattern can lead to a factor of up to two enhancement in t
he apparent noise, depending on position in the image. Even with good
suppression of the pixel granularity, however, the remaining random no
ise can exhibit saturation behavior that causes the S/N to cease impro
ving with increasing exposure. The random noise itself exhibits a two-
component character: a normal white-noise field superimposed on a filt
ered (Gaussian-like smoothing) background. The influence of the smooth
component varies strongly with position. Nevertheless, when all of th
e relevant effects are considered, the underlying ''pristine'' noise m
odels show essentially no dependence on spatial position, except for a
n unusually noisy patch on the LWP camera. Two additional sources of n
oise, beyond the largely photometric contributions documented above, a
re microphonics and cosmic particle radiation. Microphonics are import
ant in only a few exceptional circumstances, but cosmic ray ''bright s
pots'' set an effective limit of almost-equal-to 4 hr on useful SWP-LO
exposures of (unresolved) emission-line objects, even those conducted
during low-radiation time.