HIGHLY RELIABLE TESTING OF ULSI MEMORIES WITH ON-CHIP VOLTAGE-DOWN CONVERTERS

Authors
TSUKUDE M ARIMOTO K HIDAKA H KONISHI Y HAYASHIKOSHI M SUMA K FUJISHIMA K
Citation
M. Tsukude et al., HIGHLY RELIABLE TESTING OF ULSI MEMORIES WITH ON-CHIP VOLTAGE-DOWN CONVERTERS, IEEE design & test of computers, 10(2), 1993, pp. 6-12
Citations number
8
Categorie Soggetti
Computer Sciences","Computer Applications & Cybernetics
Journal title
IEEE design & test of computers → ACNP
ISSN journal
07407475
Volume
10
Issue
2
Year of publication
1993
Pages
6 - 12
Database
ISI
SICI code
0740-7475(1993)10:2<6:HRTOUM>2.0.ZU;2-7
Abstract
The authors describe new testing techniques for ultralarge-scale integ ration memories containing an on-chip voltage-down converter. One tech nique is an accurate tuning of internal V(CC) achieved by the trimming method. The other technique is a wide operating-margin test, using a stress mode in which int. V(CC) is set to various voltage conditions.