TEST ALGORITHMS FOR DOUBLE-BUFFERED RANDOM-ACCESS AND POINTER-ADDRESSED MEMORIES

Authors
VANSAS J CATTHOOR F DEMAN HJ
Citation
J. Vansas et al., TEST ALGORITHMS FOR DOUBLE-BUFFERED RANDOM-ACCESS AND POINTER-ADDRESSED MEMORIES, IEEE design & test of computers, 10(2), 1993, pp. 34-44
Citations number
16
Categorie Soggetti
Computer Sciences","Computer Applications & Cybernetics
Journal title
IEEE design & test of computers → ACNP
ISSN journal
07407475
Volume
10
Issue
2
Year of publication
1993
Pages
34 - 44
Database
ISI
SICI code
0740-7475(1993)10:2<34:TAFDRA>2.0.ZU;2-U
Abstract
Test algorithms for single-buffered memories are inadequate to test do uble-buffered memories (DBMs). This article presents test algorithms f or static double-buffered RAMs and pointer-addressed memories (PAMs). To obtain a realistic fault model, the authors perform an inductive fa ult analysis on the DBM cells. They also show that the address generat ion method imposes different requirements on the test algorithms.