CROSSCHECK - AN INNOVATIVE TESTABILITY SOLUTION

This article discusses a novel approach to the ASIC test problem that is based on embedding test structures into the base array of the ASIC. With a specially designed storage element called the cross-controlled latch, CrossCheck combines controllability and observability to produ ce a highly testable ASIC having minimal area and performance overhead . This approach also lets us go beyond the stuck-at fault model and co nsider realistic manufacturing defects.