We report on the Langmuir-Blodgett film formation and properties of a
ruthenium porphyrin complex. Multilayer films may be transferred onto
a variety of substrates. Reproducible deposition is indicated by both
optical and electrical measurements. Ellipsometry reveals the thicknes
s per layer to be 1.65 +/- 0.05 nm. A marked increase in the in-plane
electrical conductivity of these layers is found upon exposure to nitr
ogen dioxide; this effect is found to be reversible at room temperatur
e.