J. Reyesgasga et al., INSITU TRANSMISSION ELECTRON-MICROSCOPY OBSERVATION OF THE PHASE-TRANSITION IN THIN-FILMS OF THE AL-MN SYSTEM, Thin solid films, 227(1), 1993, pp. 24-31
Al-Mn thin films were produced by evaporation of the Al1-xMnx alloys,
with x = 0.10, 0.14, 0.20, 0.25 and 0.32, on NaCl substrates held at e
ither liquid-N2 temperature or room temperature. The thin films obtain
ed showed an almost amorphous structure. When these films were heated
in situ in the transmission electron microscope, several phases of the
Al-Mn system were observed during the amorphous-to-crystalline transi
tion process produced. The structural evolution observed depends on th
e chemical composition and the thickness of the film. Some of these ph
ases were Al6Mn, Al3Mn, Al4Mn, Al11Mn4, Al8Mn5, AlMn and quasi-crystal
line phases. On comparison of our results with the Al-Mn phase diagram
, it is concluded that this diagram does not reproduce completely the
situation for thin films.