ZnSxTe1-x films (0 < x < 1) have been prepared by simultaneous evapora
tion of ZnS and ZnTe powders (both of 99.999% purity) from coaxial qua
rtz crucibles placed inside a two-zone graphite heater. The films were
characterized by measuring the electrical conductivity, optical and t
hermoelectric properties. Raman scattering and structural studies usin
g X-ray diffraction, transmission electron microscopy and scanning ele
ctron microscopy measurements were carried out. Information on grain b
oundary scattering in these films was obtained.