SCANNING PROBE MICROSCOPE WITH INTERCHANGEABLE AFM-FFM AND STM HEADS

A scanning probe microscoPe operating in air with interchangeable atom ic force-friction force (AFM-FFM) and electronic-tunnelling (STM) head s is presented. Our AFM operates in the so-called contact mode and uti lizes the optical-lever detection method which allows simultaneous mea surement of the topography as well as the lateral force. The set-up al so contains an optical microscope to control both the sample and the p robe laser spot on the cantilever. The experimental method to change f rom AFM to STM operation is based on the use of the probe laser beam a nd the optical microscope. The maximum scanning area is (24 x 24) mum2 and it is well embraced in the optical-microscope visual field. The m icroscope attains atomic resolution in air in both AFM and STM configu ration. Its performance is demonstrated on the surface of different sa mples.