SURFACE CHARACTERIZATION OF ZRO2-SIO2 SYSTEMS PREPARED BY A SOL-GEL METHOD

Citation
Ja. Navio et al., SURFACE CHARACTERIZATION OF ZRO2-SIO2 SYSTEMS PREPARED BY A SOL-GEL METHOD, Applied surface science, 70-1, 1993, pp. 226-229
Citations number
18
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical
Journal title
ISSN journal
01694332
Volume
70-1
Year of publication
1993
Part
A
Pages
226 - 229
Database
ISI
SICI code
0169-4332(1993)70-1:<226:SCOZSP>2.0.ZU;2-O
Abstract
Gels with composition xZrO2 . (100 X)SiO2, x = 3-100 mol%, were prepar ed by a sol-gel method, using zirconyl chloride and commercial silica gel. Gels treated at different temperatures up to 1000-degrees-C were previously characterized by a combination of differential thermal anal ysis (DTA) and X-ray diffraction techniques. Surface characterization by means of infrared spectroscopy (IR), water-temperature-programmed d esorption combined with mass spectroscopy (TPD-MS), UV-visible diffuse reflectance spectroscopy (UV-V/DR) and scanning electron microscopy ( SEM) is reported here. The crystallization is metastable-cubic/tetrago nal zirconia occurred only when the zirconia gel was dispersed in the silica matrix. In the absence of silica gel, the prepared zirconia gel developed the monoclinic crystalline phase following thermal treatmen t. Bulk zirconium dioxide exhibited both basic and acid hydroxyl group s, the basic hydroxyl groups were lost by depositing zirconium oxide o n SiO2. Changes observed in UV-V absorption spectra are also reported.