Rh. Bergmans et al., SIMULTANEOUS ENERGY AND ANGLE-RESOLVED ION-SCATTERING SPECTROSCOPY - 1ST RESULTS, Applied surface science, 70-1, 1993, pp. 283-286
Low-energy ion scattering can give detailed information on the composi
tion and structure of the outermost atomic layers, The EARISS (energy
and angle resolved ion scattering spectrometer) makes a very efficient
use of the scattered ions by measuring simultaneously the energy and
azimuthal distributions of the scattered ions, using both a special an
alyzer and two-dimensional detection system. This reduces the required
ion dose, and thus the damage to the surface will be orders of magnit
ude smaller. In order to obtain the azimuthal distribution of the scat
tered ions it was necessary to correct for the apparatus profile. Firs
t results showing both energy and azimuthal dependent scattering from
Ni(110) are presented. Comparison of these results with ion trajectory
simulations, confirms the location of the Ni atoms in the outermost l
ayers.