N. Rando et al., X-RAY-CHARACTERISTICS OF A NIOBIUM SUPERCONDUCTING TUNNEL JUNCTION WITH A HIGHLY TRANSMISSIVE TUNNEL BARRIER, Journal of applied physics, 73(10), 1993, pp. 5098-5104
The results of an investigation into the x-ray properties of a superco
nducting tunnel junction (STJ) are presented. The photoabsorption of a
n x-ray photon by one of the thin superconducting films of the junctio
n results in the production of quasiparticles, which may subsequently
tunnel through the thin oxide barrier into the second superconducting
film. The transfer of charge across the barrier is detected, and gives
a measure of both the x-ray photon energy and the effective energy ga
p epsilon of the superconducting film in which the photoabsorption occ
urred. A charge output of 55% of the theoretical maximum has been obta
ined for a niobium-based STJ. Such a charge output indicates a mean en
ergy epsilon of congruent-to 4.7 meV is required to create a single ch
arge carrier in the junction such that epsilon/DELTA congruent-to 3, w
here 2DELTA is the junction energy gap. This is the lowest value of ep
silon/DELTA obtained to date for x-ray photoabsorption in STJs. The en
ergy resolution of the device is, however, still poor, with a full wid
th half maximum of congruent-to 200 eV for 6 keV x rays, compared with
the theoretical Fano limited resolution of congruent-to 4 eV. The pri
nciple mechanisms which are believed to degrade the resolution are dis
cussed. These are principally quasiparticle recombination, phonon leak
age out of the junction, quasiparticle diffusion into and out of the t
unneling region, in addition to possible local variations in the energ
y gap. A Monte Carlo simulation of the nonequilibrium system has been
performed. The results assist in the identification of the major charg
e loss mechanisms, and indicate various means by which Fano limited re
solution may be obtained.