EFFECT OF THE METAL-FILM THICKNESS ON SURFACE-PLASMON-ENHANCED RAMAN-SCATTERING IN AN ATTENUATED TOTAL-REFLECTION EXPERIMENT

Citation
N. Primeau et al., EFFECT OF THE METAL-FILM THICKNESS ON SURFACE-PLASMON-ENHANCED RAMAN-SCATTERING IN AN ATTENUATED TOTAL-REFLECTION EXPERIMENT, Journal of applied physics, 73(10), 1993, pp. 5158-5162
Citations number
23
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
73
Issue
10
Year of publication
1993
Part
1
Pages
5158 - 5162
Database
ISI
SICI code
0021-8979(1993)73:10<5158:EOTMTO>2.0.ZU;2-A
Abstract
We present the measured dependence of the Raman intensity on the thick ness of the metal film in a Kretschmann geometry when surface plasmons are excited. To perform our work, we deposited a Ag film of varying t hickness onto a prism, and then we coated it with a thin layer of copp er phthalocyanine. We show that the maximum of the Raman signal is ach ieved for an overall optimization of the coupling at both pump and Sto kes frequencies, demonstrating the simultaneous excitation of surface plasmons at these two frequencies.