The energy levels of defect states in nanometer-sized amorphous silico
n nitride solids were systematically studied in terms of ultraviolet e
mission spectra. Six emission bands were observed, corresponding to 3.
2, 2.8, 2.7, 2.4, 2.3, and 2.0 eV, respectively. With increasing the h
eat-treated temperature from room temperature to 1000-degrees-C in low
vacuum, these emission bands became high. For the specimen heated at
1000-degrees-C, a new emission band of 3.0 eV appeared. The appearance
of these emission bands is closely related to the formation of the en
ergy levels of the defect states in the energy gap. The origin of thes
e emission bands are discussed in detail.