SELF-CONSISTENT MODEL OF A DOUBLE-BARRIER RESONANT-TUNNELING DIODE - DEPENDENCE OF INTRINSIC BISTABILITY ON STRUCTURAL PARAMETERS

Authors
Citation
Ym. Hu et S. Stapleton, SELF-CONSISTENT MODEL OF A DOUBLE-BARRIER RESONANT-TUNNELING DIODE - DEPENDENCE OF INTRINSIC BISTABILITY ON STRUCTURAL PARAMETERS, Journal of applied physics, 73(10), 1993, pp. 5254-5263
Citations number
35
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
73
Issue
10
Year of publication
1993
Part
1
Pages
5254 - 5263
Database
ISI
SICI code
0021-8979(1993)73:10<5254:SMOADR>2.0.ZU;2-G
Abstract
A self-consistent model of the double-barrier resonant tunneling diode (RTD) that is based on the damped Fabry-Perot model and the hot-elect ron distribution approximation, is presented. Dependence of intrinsic bistability on structural parameters in the RTD has been investigated both analytically and numerically. It was found that intrinsic bistabi lity increases while the extrinsic bistability that is due to the load line effect decreases with the barrier width. This difference may be used as a criterion to distinguish intrinsic bistability from the extr insic bistability caused by the load line effect. It was found that in trinsic bistability is likely to be observed in a RTD, at low temperat ures, with a thick barrier and low doping at the collector.