This paper presents a detailed study on the non-quasi-static (NQS) eff
ects in advanced high-speed bipolar circuits. An NQS Gummel-Poon compa
tible lumped circuit model, which accounts for carrier propagation del
ays across various quasi-neutral regions in bipolar devices, is implem
ented in the ASTAP circuit simulator. The effects are then evaluated a
nd compared with the conventional Gummel-Poon model for the emitter-co
upled logic (ECL) circuit, non-threshold-logic (NTL) circuit, and vari
ous advanced circuits utilizing active-pull-down schemes. For the ECL
circuit, the effect decreases with reduced power level and increased l
oading. For the NTL circuit, due to its front-end configuration, the e
ffect is more significant than that for the ECL circuit but tends to i
ncrease with reduced power level. As the passive resistors (and the as
sociated parasitic RC effect) are decoupled from the delay path and th
e circuit delay is made more intimately related to the intrinsic speed
of the devices in various advanced active-pull-down circuits, the del
ay degradation due to NQS effect becomes more significant.