A new MOS-gated emitter switched thyristor structure with base resista
nce control, which combines the best features of both the emitter swit
ched thyristor (EST) and the base resistance controlled thyristor (BRT
), is reported for the first time. With this structure, it is possible
to obtain turn-off (dynamic) current densities above the static latch
-up current density of the parasitic thyristor in the EST, while prese
rving its unique current saturation capability. It has been experiment
ally demonstrated from 600-V forward blocking devices that the maximum
controllable current density under dynamic conditions is a function o
f both the gate bias and the dimensions of the N+ floating emitter. Tu
rn-off measurements have demonstrated that the new EST structure has a
maximum controllable current density of over 2.5 times that for the E
ST structure without base resistance control.