A novel self-aligned HBT mesa fabrication process utilizing selective
OMVPE is reported whereby the extrinsic base has been made considerabl
y thicker than the intrinsic base, thus avoiding the conventional trad
e-off between base resistance and base transit time. This technique al
so simplifies processing by eliminating the need for emitter isolation
by etching or ion implantation prior to base metallization. Applicati
on of this process to AlGaAs/GaAs N-p-n HBT's has yielded an intrinsic
to extrinsic base sheet resistance ratio of 1.5, an f(T) of 22 GHz, a
nd an f(max) of 55 GHz.