The ultrafast characteristics of crystalline-silicon metal-semiconduct
or-metal (MSM) photodiodes with 300 nm finger width and spacing were m
easured with a subpicosecond electro-optic sampling system. Electrical
responses with full width at half maximum as short as 5.5 and 11 ps,
at corresponding 3 dB bandwidths of 75 and 38 GHz, were generated by v
iolet and red photons, respectively. The difference is attributed to t
he photon penetration depth which is much larger than the diode finger
spacing at red, but smaller at violet. Light-intensity dependence was
also examined at different wavelengths, indicating a linear relation
and a higher sensitivity in the violet. These results not only demonst
rated the fastest silicon photodetector reported to date, but also pin
pointed the dominant speed-limiting factor of silicon MSM photodiodes.
A configuration is suggested to improve the speed of these detectors
at long wavelengths.