We show that optical transients due to the intersubband photoionizatio
n of the electrons from quantum wells may be observed by inserting a m
ulti-quantum-well structure in the space-charge layer of a Schottky di
ode. This method provides a direct measurement of the photoionization
cross section of a quantum well. The escape probability of the photoex
cited electron from the quantum well can thus be unambiguously deduced
. Its variation with the electric field may be described by a simple m
odel based on the statistical fluctuation of the quantum-well width.