DEFECT LEVEL FOR NONEQUIPROBABLE FAULTS IN DIGITAL ICS

Authors
CORSI F DELCONSOLE D MARZOCCA C
Citation
F. Corsi et al., DEFECT LEVEL FOR NONEQUIPROBABLE FAULTS IN DIGITAL ICS, Electronics Letters, 29(8), 1993, pp. 653-654
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
29
Issue
8
Year of publication
1993
Pages
653 - 654
Database
ISI
SICI code
0013-5194(1993)29:8<653:DLFNFI>2.0.ZU;2-J
Abstract
Common measures of test efficiency are the fault coverage and the defe ct level for a given product yield. An extension of the well known for mula relating these three quantities to the case of general non-equipr obable faults has been derived by exploiting the concept of critical a rea. This also leads to a more meaningful definition of fault coverage .