IMPROVED TRIANGULAR VOLTAGE SWEEP (TVS) TECHNIQUE FOR MEASUREMENT OF IONIC CHARGE IN MOS STRUCTURES

Authors
QUICK J SCHLEY P
Citation
J. Quick et P. Schley, IMPROVED TRIANGULAR VOLTAGE SWEEP (TVS) TECHNIQUE FOR MEASUREMENT OF IONIC CHARGE IN MOS STRUCTURES, Electronics Letters, 29(3), 1993, pp. 275-277
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
29
Issue
3
Year of publication
1993
Pages
275 - 277
Database
ISI
SICI code
0013-5194(1993)29:3<275:ITVS(T>2.0.ZU;2-H
Abstract
The sensitivity and accuracy of the conventional TVS technique is infl uenced by a capacitive current associated with the MOS capacitor which is superimposed on the ionic current. The Letter presents a new metho d and measuring circuit for automatic compensation of the capacitive c urrent at the input of the current measuring instrument.