TEST CELLS FOR EVALUATION OF LOW CURRENTS AND CAPACITANCES

Authors
KHALKHAL A NOUET P GIRARD P
Citation
A. Khalkhal et al., TEST CELLS FOR EVALUATION OF LOW CURRENTS AND CAPACITANCES, Electronics Letters, 29(3), 1993, pp. 290-291
Citations number
3
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
29
Issue
3
Year of publication
1993
Pages
290 - 291
Database
ISI
SICI code
0013-5194(1993)29:3<290:TCFEOL>2.0.ZU;2-2
Abstract
A method allowing the determination of currents and capacitances in th e fA and fF range, respectively, is presented. It consists in a test c ell associated with a standard measurement equipment. The principle is described and experimental results illustrate some possibilities of t his method.