COMPLETE CHARACTERIZATION OF LASER-DIODE THERMAL CIRCUIT BY VOLTAGE TRANSIENT MEASUREMENTS

Authors
PICCIRILLO A OLIVETI G CIAMPA M BAGNOLI PE
Citation
A. Piccirillo et al., COMPLETE CHARACTERIZATION OF LASER-DIODE THERMAL CIRCUIT BY VOLTAGE TRANSIENT MEASUREMENTS, Electronics Letters, 29(3), 1993, pp. 318-320
Citations number
3
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
29
Issue
3
Year of publication
1993
Pages
318 - 320
Database
ISI
SICI code
0013-5194(1993)29:3<318:CCOLTC>2.0.ZU;2-Q
Abstract
The equivalent thermal circuit of laser diodes plus their dissipating structures was completely characterised using a method based on the me asurement of device voltage transient behaviour under pulsed bias. The experiments performed on ridge type lasers with copper submount showe d the contributions of the mounting configuration and the solder layer to the thermal resistance of the structure.