INCOHERENT IMAGING OF THIN SPECIMENS USING COHERENTLY SCATTERED ELECTRONS

We consider the imaging of phase objects using a scanning transmission electron microscope equipped with a large inner-angle annular detecto r. We show, contrary to popular expectation, that incoherent imaging t heory can be used to describe the imaging process in a plane perpendic ular to the optical axis. Interference effects between atoms possessin g the same projected coordinates must, however, be considered explicit ly.