The duplex oxide structure produced by the oxidation of an industrial
Cu-70-Ni-30 alloy has been studied by near-grazing X-ray diffraction,
dynamic SIMS and reflectance spectroscopy (UV-visible and IR). Optical
methods allow: the identification of the different oxides Cu(x)O (pre
cursor of copper(I) oxides) Cu2O, CuO and NiO and the thickness measur
ements relative to the copper oxide/nickel oxide interface. The main i
mpurities (Mn, Fe, Mg and Si) could accelerate the oxidability of indu
strial alloys. .