Aj. Tang et al., SELECTIVE ETCHING OF ALXGA1-XAS AND IN(ALXGA1-X)AS ALLOYS IN SUCCINICACID HYDROGEN-PEROXIDE SOLUTIONS, Journal of the Electrochemical Society, 140(5), 1993, pp. 82-83
Succinic acid-hydrogen peroxide solutions were used to etch AlxGa1-xAs
and In(AlxGa1-x)As alloys, and the etch rates were investigated with
the varying alloy mole fractions. It was found that AlxGa1-xAs (x less
-than-or-equal-to 0.4) may be selectively etched over AlxGa1-yAs (y gr
eater-than-or-equal-to 0.5), with a selectivity better than 150. Exten
ded surface exposure to air was found to affect the etch rates, most i
nterestingly for Al0.4Ga0.6As. In the In(AlxGa1-x)As system, alloys wi
th x less-than-or-equal-to 0.8 can be preferentially etched over In0.5
2Al0.48As with a selectivity of better than 20.