NUMERICAL-ANALYSES ON THERMOFLUID EFFECTS IN HORIZONTAL SILICON CHEMICAL-VAPOR DEPOSITION REACTORS

Authors
Citation
U. Narusawa, NUMERICAL-ANALYSES ON THERMOFLUID EFFECTS IN HORIZONTAL SILICON CHEMICAL-VAPOR DEPOSITION REACTORS, Journal of the Electrochemical Society, 140(5), 1993, pp. 1509-1517
Citations number
22
Categorie Soggetti
Electrochemistry
ISSN journal
00134651
Volume
140
Issue
5
Year of publication
1993
Pages
1509 - 1517
Database
ISI
SICI code
0013-4651(1993)140:5<1509:NOTEIH>2.0.ZU;2-U
Abstract
A numerical study is performed for the Si deposition from silane in a horizontal rectangular reactor. The deposition rate is affected by var ious hydrodynamic, thermal, and concentration parameters. The hydrodyn amic effects of flow velocity and duct dimensions on the film growth r ate are well-correlated by the use of the inverse Graetz number as the streamwise nondimensional lengthscale. The effects of the aspect rati o and the thermal boundary conditions on the distributions of the film growth rate are examined in detail.