DEFECTS ANALYSIS OF INSITU GROWN BISRCACUO THIN-FILMS

Using the in situ laser ablation deposition technique, we have grown t hin superconducting films of the ''2212'' phase of the Bi compound (i. e. Bi2Sr2Ca1Cu2O8+y). Depending upon the precise growth conditions, va rious kinds of defects can be observed in such films : disturbed surfa ce morphology, intergrowth of various phases and crystalline defects w hich can degrade the transport properties of the films. The nature and density of these defects in the films have been studied, and possible ways to obtain defect free epitaxial BiSrCaCuO thin films are present ed and discussed.