G. Ries et al., PINNING ENERGY IN HTSC AND ITS INFLUENCE ON ELECTRIC AND MAGNETIC-PROPERTIES, Journal of alloys and compounds, 195(1-2), 1993, pp. 379-385
We investigated the voltage-current (V-1) characteristics in polycryst
alline, melt textured an epitaxially grown Bi-2212 superconductors, in
Bi-2223 melt textured Ag tapes and in Y-123 films. In all samples the
V-I curves are well described by a power law behaviour V(is-proportio
nal-to) I(P) over many orders of magnitude in the voltage V. With incr
easing magnetic field and temperature the exponent p decreases with 1/
B from a maximum at p = 10 -20 down to the ohmic limit p = 1. In a dou
ble logarithmic plot the V-I lines extrapolate to a common hinge point
. These results are interpreted within the frame of thermally activate
d flux creep. From the measurements on thin films and bulk of Bi2Sr2Ca
Cu2Ox we derive an expression for an effective activation energy U(eff
)(B,T,j) = 60 meV/B (1-T/T(c))5/2 In j0/j. We show that a number of ex
perimental observations are in accordance with this explicit result. I
n particular (a) exponential decay of the critical current density wit
h field, (b) nonlogarithmic flux creep and (c) the irreversibility fie
ld B(irr)(T) emerge as consequences of the specific functional depende
nce of U(eff).