APPLICATION OF INVERSE PROBLEMS TO EMC

Citation
S. Hayashi et al., APPLICATION OF INVERSE PROBLEMS TO EMC, NEC research & development, 34(2), 1993, pp. 206-215
Citations number
NO
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
0547051X
Volume
34
Issue
2
Year of publication
1993
Pages
206 - 215
Database
ISI
SICI code
0547-051X(1993)34:2<206:AOIPTE>2.0.ZU;2-2
Abstract
A metallic enclosure model is set to simulate the electronic equipment which leaks electromagnetic waves through the equipment enclosure. Th e magnetic field near the metallic enclosure is measured by use of the measuring systems. Using the measured magnetic field data, current de nsity distribution on the metallic box surface is determined by solvin g inverse problem. Box surface current density distributions can be ob tained by solving the integral equation numerically in least squares s ense. Solutions of the inverse problems showed the calculated strong c urrent regions on the metallic box surface correspond to the regions w here real magnetic fields leak out. These facts suggest that computing the inverse problem solutions numerically is a tool applicable to EMC (Electromagnetic Compatibility).