APPLICATION OF INVERSE PROBLEMS TO EMC
Citation
S. Hayashi et al., APPLICATION OF INVERSE PROBLEMS TO EMC, NEC research & development, 34(2), 1993, pp. 206-215
Categorie Soggetti
Engineering, Eletrical & Electronic
SICI code
0547-051X(1993)34:2<206:AOIPTE>2.0.ZU;2-2
Abstract
A metallic enclosure model is set to simulate the electronic equipment
which leaks electromagnetic waves through the equipment enclosure. Th
e magnetic field near the metallic enclosure is measured by use of the
measuring systems. Using the measured magnetic field data, current de
nsity distribution on the metallic box surface is determined by solvin
g inverse problem. Box surface current density distributions can be ob
tained by solving the integral equation numerically in least squares s
ense. Solutions of the inverse problems showed the calculated strong c
urrent regions on the metallic box surface correspond to the regions w
here real magnetic fields leak out. These facts suggest that computing
the inverse problem solutions numerically is a tool applicable to EMC
(Electromagnetic Compatibility).