TRACE ANALYSIS OF CERAMIC SURFACES BY LASER IONIZATION MASS-SPECTROMETRY

Authors
BECKER JS DIETZE HJ
Citation
Js. Becker et Hj. Dietze, TRACE ANALYSIS OF CERAMIC SURFACES BY LASER IONIZATION MASS-SPECTROMETRY, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 134-137
Citations number
4
Categorie Soggetti
Chemistry Analytical
Journal title
Fresenius' journal of analytical chemistry → ACNP
ISSN journal
09370633
Volume
346
Issue
1-3
Year of publication
1993
Pages
134 - 137
Database
ISI
SICI code
0937-0633(1993)346:1-3<134:TAOCSB>2.0.ZU;2-D
Abstract
Laser ionization mass spectrometry (LIMS) is an analytical method for the simultaneous determination of concentrations of trace elements in solid samples and for the analysis of layers with thicknesses > 1 mum. This laser-induced surface analytical method is limited by the laser focus and crater depth of the laser system applied. Results of mass sp ectrometric trace analysis on a silicon carbide surface, ZrO2 and high -T(c) superconducting ceramics are discussed.