Iw. Drummond et al., PRACTICAL POLYMER FILM CHARACTERIZATION USING HIGH-PERFORMANCE XPS METHODS, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 200-204
New features of laboratory XPS instrument design have resulted in larg
e increases in sensitivity for microprobe style analysis (''spatially
keyed spectroscopy''). These capabilities give access to XPS valence b
and and other high resolution information for polymer analysis on a ro
utine basis. Examples of the practical use of these techniques are pre
sented.