W. Hilgers et al., COMPACT DATA-PROCESSING AND CONTROL-SYSTEM FOR SIMS AND AES, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 208-210
An improved version of a data processing and control system has been u
sed with state-of-the-art AES and SIMS instruments. It consists of a m
ainframe with CPU, buffer and IEEE 488 interface to a host computer an
d a range of plug-in submodules. Its features include three-dimensiona
l analysis, imaging, multichannel spectra and sample bias control. The
performance of the system has been tested by AES and SIMS depth profi
le measurements of Si-Ge multilayers.