Citation
R. Mutter et al., STRUCTURE OF THIN BLOCK-COPOLYMER FILMS STUDIED BY X-RAY REFLECTIVITY, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 297-299
Citations number
9
Categorie Soggetti
Chemistry Analytical
Journal title
ISSN journal
09370633
Volume
346
Issue
1-3
Year of publication
1993
Pages
297 - 299
Database
ISI
SICI code
0937-0633(1993)346:1-3<297:SOTBFS>2.0.ZU;2-L
Abstract
X-ray reflectivity may be used to determine the internal structure of
thin polymer films. An electron density difference of 10% for polystyr
ene and polyisoprene is sufficient to distinguish between a random dis
tribution of lamellae, complete orientation parallel to the substrate
surface and a surface induced formation of lamellae. The disappearance
of the lamellar Bragg-peaks, with heating of the film, shows the tran
sition into the disordered state.