H. Kasten et G. Strobl, INVESTIGATIONS OF OPTICAL ANISOTROPY AT POLYMER SURFACES AND IN THIN POLYMER-FILMS BY VARIABLE-ANGLE ELLIPSOMETRY, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 300-302
Variable angle ellipsometry has been used to study laterally homogeneo
us, interfacial structures whose index of refraction varies only in th
e normal direction. A polyimide film (almost-equal-to 1.4 mum thick) w
as studied on glass and the thickness and the indices of anisotropy n(
perpendicular-to) and n(parallel-to) perpendicular and parallel to the
lateral plane determined with high precision. Better fits to experime
ntal data were obtained by assuming an additional thin layer, with dif
ferent film parameters, at the polymer/substrate interface.