INVESTIGATIONS OF OPTICAL ANISOTROPY AT POLYMER SURFACES AND IN THIN POLYMER-FILMS BY VARIABLE-ANGLE ELLIPSOMETRY

Authors
Citation
H. Kasten et G. Strobl, INVESTIGATIONS OF OPTICAL ANISOTROPY AT POLYMER SURFACES AND IN THIN POLYMER-FILMS BY VARIABLE-ANGLE ELLIPSOMETRY, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 300-302
Citations number
4
Categorie Soggetti
Chemistry Analytical
ISSN journal
09370633
Volume
346
Issue
1-3
Year of publication
1993
Pages
300 - 302
Database
ISI
SICI code
0937-0633(1993)346:1-3<300:IOOAAP>2.0.ZU;2-C
Abstract
Variable angle ellipsometry has been used to study laterally homogeneo us, interfacial structures whose index of refraction varies only in th e normal direction. A polyimide film (almost-equal-to 1.4 mum thick) w as studied on glass and the thickness and the indices of anisotropy n( perpendicular-to) and n(parallel-to) perpendicular and parallel to the lateral plane determined with high precision. Better fits to experime ntal data were obtained by assuming an additional thin layer, with dif ferent film parameters, at the polymer/substrate interface.