O. Dessenne et al., HETEROGENEOUS ELEMENT DISTRIBUTION - A CONTRIBUTION TO QUANTITATIVE GDOS DEPTH ANALYSIS, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 340-345
The apparent enrichment of Cu, Mg, Mn and Si on the surface of Al cast
-alloys, as observed by means of glow discharge optical emission spect
rometry (GDOS), could be attributed to the heterogeneous distribution
of the alloying elements. The samples under investigation were spectro
chemical standards and hence assumed to be homogeneous. Different meta
llurgical phases were identified which induced selective sputtering. T
he findings point out that quantitative results obtained by GDOS in-de
pth analysis can be misleading and should be confirmed by other techni
ques such as Auger Electron Spectrometry and Energy Dispersive X-ray S
pectrometry, which are free from sputter effects.