HETEROGENEOUS ELEMENT DISTRIBUTION - A CONTRIBUTION TO QUANTITATIVE GDOS DEPTH ANALYSIS

Citation
O. Dessenne et al., HETEROGENEOUS ELEMENT DISTRIBUTION - A CONTRIBUTION TO QUANTITATIVE GDOS DEPTH ANALYSIS, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 340-345
Citations number
23
Categorie Soggetti
Chemistry Analytical
ISSN journal
09370633
Volume
346
Issue
1-3
Year of publication
1993
Pages
340 - 345
Database
ISI
SICI code
0937-0633(1993)346:1-3<340:HED-AC>2.0.ZU;2-3
Abstract
The apparent enrichment of Cu, Mg, Mn and Si on the surface of Al cast -alloys, as observed by means of glow discharge optical emission spect rometry (GDOS), could be attributed to the heterogeneous distribution of the alloying elements. The samples under investigation were spectro chemical standards and hence assumed to be homogeneous. Different meta llurgical phases were identified which induced selective sputtering. T he findings point out that quantitative results obtained by GDOS in-de pth analysis can be misleading and should be confirmed by other techni ques such as Auger Electron Spectrometry and Energy Dispersive X-ray S pectrometry, which are free from sputter effects.