D. Wang et Fr. Jones, TOF-SIMS AND XPS STUDIES OF THE INTERACTION OF SILANES AND MATRIX RESINS WITH GLASS SURFACES, Surface and interface analysis, 20(5), 1993, pp. 457-467
The interface between glass, glass fibres and epoxy resin in a composi
te has been studied using time-of-flight secondary ion mass spectromet
ry in static and scanning modes in combination with x-ray photoelectro
n spectroscopy. The presence of a multilayer of the polymeric hydrolys
ed gamma-aminopropyltriethoxysilane (HAPS) on the glass surfaces has b
een confirmed. After extraction with bot water or toluene only a monom
olecular interfacial layer of HAPS is chemically bound to the immediat
e glass surface through siloxane bonds, leaving the amino groups at th
e outer surface and available for reaction. It has been demonstrated t
hat this interfacial layer plays an essential role in the coupling rea
ction between the amino group of the HAPS deposit and the epoxide grou
p of the epoxy resins, diglycidyl ether of bisphenol A or S (DGEBA or
DGEBS). These interfacial reactions were complicated by the presence o
f polydimethylsiloxane and the incorporation of substrate aluminium in
to the HAPS deposit. The aluminium sites appeared not to be involved i
n the coupling reaction.