EXAMINATION OF THE ELECTRONIC-STRUCTURE OF TIO2(110) USING PHOTOELECTRON DIFFRACTION

Authors
Citation
R. Heise et R. Courths, EXAMINATION OF THE ELECTRONIC-STRUCTURE OF TIO2(110) USING PHOTOELECTRON DIFFRACTION, Surface science, 287, 1993, pp. 658-661
Citations number
17
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
287
Year of publication
1993
Part
B
Pages
658 - 661
Database
ISI
SICI code
0039-6028(1993)287:<658:EOTEOT>2.0.ZU;2-U
Abstract
With the use of X-ray excited polar core-level and valence-band photoe lectron-diffraction patterns (XPED) and corresponding energy distribut ion curves from TiO2(110) (rutile) along various azimuths in the surfa ce plane, projected partial densities-of-states of the constituents in the valence band have been extracted. The results obtained from this angle-resolved method do not depend on the electron exit angle and see m to be a good measure for state densities of the bulk. A comparison w ith electronic structure calculations is given.