We have studied the growth of ultrathin (< 50 angstrom) Cu overlayers
on stoichiometric TiO2(110) surfaces. Using low energy ion scattering,
the growth mode of Cu was determined to be Volmer-Weber type (three-d
imensional islands) at room temperature; evidence for cluster growth i
s observed even at 160 K. A comparison with Fe and Cr metal films show
s that the spreading of the films correlates with the heat of formatio
n of the metal oxide of the overlayer. Fe and Cr cause a reduction of
the Ti4+ surface cations at the metal/metal oxide interface as observe
d with X-ray photoelectron spectroscopy. No reduction of the TiO2 cati
ons takes place upon contact with a Cu overlayer.