GROWTH OF AU ON CU(001) STUDIED BY FULL HEMISPHERICAL PHOTOELECTRON DIFFRACTION

Authors
NAUMOVIC D OSTERWALDER J STUCK A AEBI P SCHLAPBACH L
Citation
D. Naumovic et al., GROWTH OF AU ON CU(001) STUDIED BY FULL HEMISPHERICAL PHOTOELECTRON DIFFRACTION, Surface science, 287, 1993, pp. 950-954
Citations number
23
Categorie Soggetti
Chemistry Physical
Journal title
Surface science → ACNP
ISSN journal
00396028
Volume
287
Year of publication
1993
Part
B
Pages
950 - 954
Database
ISI
SICI code
0039-6028(1993)287:<950:GOAOCS>2.0.ZU;2-0
Abstract
Ultrathin Au films of 1 to 10 monolayers (ML) have been deposited in s itu on Cu(001) at room temperature. Their structure has been investiga ted by X-ray photoelectron diffraction (XPD), presented as full solid angle intensity maps of the Au 4d5/2 peak, and by low energy electron diffraction. The XPD patterns change from fourfold fcc (001) at low co verage to threefold fcc (111) at high coverage. The goal of this work is to reveal the different steps of such a drastic structure transform ation.