APPLICATION OF THE AUGER PARAMETER IN THE CHARACTERIZATION OF SMALL COPPER PARTICLES SUPPORTED ON INSULATORS

Authors
Citation
G. Moretti et P. Porta, APPLICATION OF THE AUGER PARAMETER IN THE CHARACTERIZATION OF SMALL COPPER PARTICLES SUPPORTED ON INSULATORS, Surface science, 287, 1993, pp. 1076-1081
Citations number
27
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
287
Year of publication
1993
Part
B
Pages
1076 - 1081
Database
ISI
SICI code
0039-6028(1993)287:<1076:AOTAPI>2.0.ZU;2-N
Abstract
A simple electrostatic model permits the estimation of Auger parameter shifts of core-ionized atoms in compounds with respect to the free at om in the gas phase. It is shown that the Auger parameter shift is a f unction of the number, distance, electronic polarizability and local g eometry of the nearest-neighbour ligands around the core-ionized atom. We have investigated the relationship between the Cu Auger parameter shifts and the nuclearity of Cu clusters entrapped in A zeolites. It i s shown that our model is useful to estimate this dependence. The mode l has also been applied with success to rationalize Auger parameter da ta on small copper clusters supported on alpha-Al2O3 (0001) surfaces a nd polycrystalline ZnO and graphite. We demonstrate that the screening properties of metal bulk and clusters of very low nuclearity are very similar.