A NEW DEVICE FOR ELECTRICAL-RESISTIVITY MEASUREMENTS AS A FUNCTION OFTEMPERATURE (86-K 700-K) UNDER CONTROLLED-ATMOSPHERE BY THE 4-PROBE METHOD

Authors
KOKABI HR PROVOST J DESGARDIN G
Citation
Hr. Kokabi et al., A NEW DEVICE FOR ELECTRICAL-RESISTIVITY MEASUREMENTS AS A FUNCTION OFTEMPERATURE (86-K 700-K) UNDER CONTROLLED-ATMOSPHERE BY THE 4-PROBE METHOD, Review of scientific instruments, 64(6), 1993, pp. 1549-1553
Citations number
19
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
64
Issue
6
Year of publication
1993
Pages
1549 - 1553
Database
ISI
SICI code
0034-6748(1993)64:6<1549:ANDFEM>2.0.ZU;2-4
Abstract
A device for measuring electrical resistivity as a function of tempera ture using unsoldered, sharp, and independent contacts has been develo ped. The probes are fixed on fine ceramic tubes, which are actuated by pressure-sensitive springs. The ceramic tubes are guided by metallic struts that also serve as thermal screens. The device is placed in an enclosure where a primary vacuum is established and introduce a neutra l, reducing, or oxidizing gas. Measurement can be performed continuall y between 86 and 700 K. Materials having resistivities in the 10(-8)-1 0(6) OMEGA m range have been characterized even when they present resi stivity jumps of many orders of magnitude.