X-RAY PHOTOACOUSTIC-SPECTROSCOPY OF ZNO THIN-FILM

Citation
T. Toyoda et al., X-RAY PHOTOACOUSTIC-SPECTROSCOPY OF ZNO THIN-FILM, JPN J A P 1, 32(5B), 1993, pp. 2550-2553
Citations number
21
Categorie Soggetti
Physics, Applied
Volume
32
Issue
5B
Year of publication
1993
Pages
2550 - 2553
Database
ISI
SICI code
Abstract
The hard X-ray photoacoustic spectrum of ZnO thin film has been obtain ed in the EXAFS (extended X-ray absorption fine structure) region usin g synchrotron radiation. It is shown that information on EXAFS is incl uded in the X-ray photoacoustic signal intensity and phase spectra whi ch reflect the heat production processes in ZnO thin film. However, th e results showed that the increases and changes in the photoacoustic s ignal intensity were different from those of the photoacoustic signal phase in the EXAFS region.