T. Toyoda et al., DEPENDENCE OF THE X-RAY PHOTOACOUSTIC SIGNAL INTENSITY OF PURE COPPERAND BRASS ON SAMPLE THICKNESS, JPN J A P 1, 32(5B), 1993, pp. 2554-2556
The hard X-ray photoacoustic signal intensities (I) of pure copper and
brass have been measured in the Cu K-edge region as a function of sam
ple thickness (d) (from 5 mum to 100 mum). It is shown that the photoa
coustic signal intensities of pure copper and brass decrease above the
sample thickness of 10 mum for each modulation frequency. The absolut
e values of the power law, d(ln I)/d(In d), of pure copper and brass d
epend on modulation frequency.