DEPENDENCE OF THE X-RAY PHOTOACOUSTIC SIGNAL INTENSITY OF PURE COPPERAND BRASS ON SAMPLE THICKNESS

Citation
T. Toyoda et al., DEPENDENCE OF THE X-RAY PHOTOACOUSTIC SIGNAL INTENSITY OF PURE COPPERAND BRASS ON SAMPLE THICKNESS, JPN J A P 1, 32(5B), 1993, pp. 2554-2556
Citations number
14
Categorie Soggetti
Physics, Applied
Volume
32
Issue
5B
Year of publication
1993
Pages
2554 - 2556
Database
ISI
SICI code
Abstract
The hard X-ray photoacoustic signal intensities (I) of pure copper and brass have been measured in the Cu K-edge region as a function of sam ple thickness (d) (from 5 mum to 100 mum). It is shown that the photoa coustic signal intensities of pure copper and brass decrease above the sample thickness of 10 mum for each modulation frequency. The absolut e values of the power law, d(ln I)/d(In d), of pure copper and brass d epend on modulation frequency.