FLUX-CREEP IN YBA2CU3O7-Y THIN-FILMS INDUCED BY SELF-FIELD OF THE TRANSPORT CURRENT

Citation
R. Kumar et al., FLUX-CREEP IN YBA2CU3O7-Y THIN-FILMS INDUCED BY SELF-FIELD OF THE TRANSPORT CURRENT, Applied superconductivity, 1(7-9), 1993, pp. 1061-1069
Citations number
14
Categorie Soggetti
Material Science","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
09641807
Volume
1
Issue
7-9
Year of publication
1993
Pages
1061 - 1069
Database
ISI
SICI code
0964-1807(1993)1:7-9<1061:FIYTIB>2.0.ZU;2-9
Abstract
Self-field induced flux creep has been studied in YBa2Cu3O7-y thin fil ms in zero external field at temperatures below T(c). Self-field induc ed flux creep model, which is the extension of Anderson and Kim conven tional flux creep model has been introduced. The verification of the m odel has been done by performing voltage-current measurements on patte rned YBa2Cu3O7-y thin films. The variation of pinning potential, U0, a s function of temperature is obtained.