Y. Okada et al., EVALUATION OF INTERFACIAL NITROGEN CONCENTRATION OF RTP OXYNITRIDES BY REOXIDATION, Journal of the Electrochemical Society, 140(6), 1993, pp. 87-89
We prepared oxynitrides with different interfacial nitrogen concentrat
ion ([N(int)]) using RTP. Reoxidation kinetics of these oxynitrides wa
s studied. It was found that reoxidation thickness strongly depends on
the [N(int)]. The reoxidation kinetics can be used for the evaluation
of [N(int)].